Characterization Tools
Device | Name | Manufacturer | Specification |
---|---|---|---|
Atomic force microscope | MFP-3D Infinity | Oxford Instruments | Resolution: lateral 1 – 10 nm, vertical under 1 nm |
Confocal 3D Laser-scanning microscope | VKX-3000 | Keyance | Microscope with laser and white light measuring features Magnification 5x, 10x, 20x, 50x, 100x and 150x |
FT-IR-Spectrometer | Alpha II | Bruker | Probes physical state: solid, fluid, gas |
Gas chromatograph | 8860 GC System | Agilent | Modified through Joint Analytical GmbH Two detectors: Helium-ionisation detector with pulsed discharge (HID) and thermal conductivity detector (TCD) |
Light microscope | D-800 Series | Optika | Magnification 10x, 20x, 40x and 100x |
Precision scales 5x | VWR | 0.1 mg – 2200 g | |
SEM | Regulus 8220 | Hitachi | With EDX |
SP-150e | Potentiostat | BioLogic | Broad range of general electrochemical measurement. Current ranges from ± 1A to ± 10 μA with a resolution of 0.004 % of the range (min 760 pA) |
Temperature controllers | Modul 335 and 336 | LakeShore | |
Thermal Camera | SC 7000 | FLIR | |
Vector Network Analyzer | SNA 5002 A | Siglent | 9 kHz – 4.5 GHz 2 ports Spectrum Analyzer function |
XES Spektrometer | easyXES 150 | easyXES | Emmision and absorption, 35 kV, 2,8 A; palladium and tungsten source |
XRD | Advanced 8 | Bruker | 40 V, 40 A copper reflection mode theta-2theta 50 V, 35 A silver 2theta Automatic sample exchange Heating cell Air tight sample carrier Normal mode copper source PDF modus with silver source |